3 November 1995 Determination of temperature changes of refractive index and thickness of material in one optical interference experiment
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Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226175
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine
Abstract
An optical interference method for simultaneous determination of the temperature dependences of refractive index n(T) and thickness 1(T) of transparent parallel-plane samples has been worked out. The method has been applied to a glass plate sample, and it was shown that dn/dT and (d1/dT)/1) temperature derivatives satisfactorily correlate with corresponding reference data. The determined inaccuracies of temperature changes of (delta) n/n and (delta) 1/1 have not exceeded 10-4. Investigation of (NH4)2SbF5 crystal by the proposed optical-interference method has confirmed the occurrence of the second order phase transitions at 292 and 168 K.
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Bohdan V. Andriyevsky, Bohdan V. Andriyevsky, Mykola O. Romanyuk, Mykola O. Romanyuk, "Determination of temperature changes of refractive index and thickness of material in one optical interference experiment", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226175; https://doi.org/10.1117/12.226175
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