3 November 1995 Determination of temperature changes of refractive index and thickness of material in one optical interference experiment
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Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226175
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine
Abstract
An optical interference method for simultaneous determination of the temperature dependences of refractive index n(T) and thickness 1(T) of transparent parallel-plane samples has been worked out. The method has been applied to a glass plate sample, and it was shown that dn/dT and (d1/dT)/1) temperature derivatives satisfactorily correlate with corresponding reference data. The determined inaccuracies of temperature changes of (delta) n/n and (delta) 1/1 have not exceeded 10-4. Investigation of (NH4)2SbF5 crystal by the proposed optical-interference method has confirmed the occurrence of the second order phase transitions at 292 and 168 K.
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Bohdan V. Andriyevsky, Bohdan V. Andriyevsky, Mykola O. Romanyuk, Mykola O. Romanyuk, } "Determination of temperature changes of refractive index and thickness of material in one optical interference experiment", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226175; https://doi.org/10.1117/12.226175
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