Far-infrared spectroscopy of polar semiconductor superlattices (GaAs-GaPxAs1-x)

Nikolas L. Dmitruk; Anatoliy V. Goncharenko; Oleg S. Gorea; Volodymyr R. Romaniuk; Olga M. Tatarinscaia; Evgenie F. Venger

doi:10.1117/12.226155

3 November 1995 Far-infrared spectroscopy of polar semiconductor superlattices (GaAs-GaP_xAs_1-x)

Nikolas L. Dmitruk, Anatoliy V. Goncharenko, Oleg S. Gorea, Volodymyr R. Romaniuk, Olga M. Tatarinscaia, Evgenie F. Venger

Author Affiliations +

Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226155
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine

Abstract

The features of the infrared reflection spectroscopy are considered for long-period semiconductor superlattices. Taking the GaAs/GaP_xAs_1-x superlattice system as an example, the applicability of the bulk model is related to light penetration/localization depths. We propose to use relative measurements (i.e. to study R_pR_s spectra) for raising the accuracy of determination of superlattice parameters by solving the inverse problem.

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Nikolas L. Dmitruk, Anatoliy V. Goncharenko, Oleg S. Gorea, Volodymyr R. Romaniuk, Olga M. Tatarinscaia, and Evgenie F. Venger "Far-infrared spectroscopy of polar semiconductor superlattices (GaAs-GaP_xAs_1-x)", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); https://doi.org/10.1117/12.226155

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