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3 November 1995 Investigation of glass structure in As(Sb)-S(Se)-I systems by the methods of Raman spectroscopy and x-ray diffraction
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Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226221
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine
Abstract
By the methods of Raman spectroscopy and x ray diffraction we studied the short-range order structure of binary and ternary glassy alloys in As(Sb)-S(Se)-I systems. The types of bonds and main structural parameters are defined. On the basis of the obtained results the model of 'microheterogeneous' glass structure was worked out.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. M. Rubish, I. Yurkin, V. Malesh, Vassyl' Fedelesh, M. L. Trunov, and D. Semak "Investigation of glass structure in As(Sb)-S(Se)-I systems by the methods of Raman spectroscopy and x-ray diffraction", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); https://doi.org/10.1117/12.226221
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