3 November 1995 Measurement of reflection factor of recording coating of optical information carrier on cylindrical substrate
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Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226128
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine
Abstract
For measurements of reflection factor of recording cover, deposited on internal surface of glass cylindrical tube, we designed and manufactured a stand. It permits us to conduct the measurement of reflection factor of recording cover of optical information carrier within a time of not more than 25 s. The measurement of reflection factor is conducted on an 0.83 mkm wavelength of semi-conductor infrared laser. We admit the measurement of reflection factor for samples on flat substrates.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. D. Leonetz, A. D. Leonetz, V. G. Kravetz, V. G. Kravetz, Andrey A. Kryuchin, Andrey A. Kryuchin, } "Measurement of reflection factor of recording coating of optical information carrier on cylindrical substrate", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226128; https://doi.org/10.1117/12.226128
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