3 November 1995 Optical diagnostics of thermoplastic dielectric and semiconductor material in thin layers
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Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226130
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine
Abstract
The method and installation for defining the dynamic viscosity coefficient, electric resistance coefficient, in thin layers of dielectric and semiconductor materials in stringy state are represented.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergey A. Voronov, Sergey A. Voronov, Oleg Borisovich Katkovskiy, Oleg Borisovich Katkovskiy, Sergey Alexandrov Neduzhiy, Sergey Alexandrov Neduzhiy, Alexander Vladimirov Solovyov, Alexander Vladimirov Solovyov, Yuriy Georgievic Statnikov, Yuriy Georgievic Statnikov, } "Optical diagnostics of thermoplastic dielectric and semiconductor material in thin layers", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226130; https://doi.org/10.1117/12.226130
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