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3 November 1995 Optical test method of HTSC structures for creating miniature elements and devices for the optical-instrument-building industry
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Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226164
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine
Abstract
HTSC structures based on epitaxial YBCO films subjected to He-Ne laser irradiation have been studied. Two- and three-dimensional images of local resistive regions have been obtained. These give an opportunity to analyze the homogeneity of HTSC films.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
I. V. Korotash and E. M. Rudenko "Optical test method of HTSC structures for creating miniature elements and devices for the optical-instrument-building industry", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); https://doi.org/10.1117/12.226164
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