Recording media based on As-S thin films prepared at low temperature

M. L. Trunov; Nicolai D. Savchenko; N. Y. Baran; V. M. Rubish

doi:10.1117/12.226140

3 November 1995 Recording media based on As-S thin films prepared at low temperature

M. L. Trunov, Nicolai D. Savchenko, N. Y. Baran, V. M. Rubish

Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226140
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine

Abstract

Film deposition parameters affect on the photographic characteristics (sensitivity and image contrast) of As₂S₃ films used as recording media for the optical storage has been investigated.

Citation Download Citation

M. L. Trunov, Nicolai D. Savchenko, N. Y. Baran, and V. M. Rubish "Recording media based on As-S thin films prepared at low temperature", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); https://doi.org/10.1117/12.226140

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