3 November 1995 Recording media based on As-S thin films prepared at low temperature
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Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226140
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine
Abstract
Film deposition parameters affect on the photographic characteristics (sensitivity and image contrast) of As2S3 films used as recording media for the optical storage has been investigated.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. L. Trunov, Nicolai D. Savchenko, N. Y. Baran, V. M. Rubish, "Recording media based on As-S thin films prepared at low temperature", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226140; https://doi.org/10.1117/12.226140
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