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25 March 1996 High-resolution trilinear color TDI CCD image sensor
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We have developed a 6032 element, 32 stage Tri-linear Time Delay and Integration Focal Plane Array for high resolution color imaging applications. The sensor offers an improvement of a factor of 10 over comparable line scan CCD sensors. The imager architecture utilizes three individual TDI arrays, with a new multi-layer dielectric interference film color filter that helps achieve accurate spectral separation in the three primary color bands centered at 450 nm, 550 nm and 650 nm respectively. We have also incorporated in the sensor a new programmable responsivity mechanism. This is achieved by an on-chip imaging area size selection mechanism. The sensors operate in the time-delay-and-integration mode. Depending on the level of illumination the user is able to dynamically select the number of TDI stages per sensor. The total number of TDI gain stages can be selected in blocks of 32, 16, 8, or 4. This property provides improvement in the dynamic range of the sensor by extending the response of the CCD over a wide range of illumination levels. Depending on the light energy incident on the sensor, the user can dynamically vary the number of TDI stages used for integrating an incident scene. The result is a programmable responsivity depending on the level of incident illumination. Such a technique optimizes the performance of the CCD color sensor. Given the resolution, speed, sensitivity and the dynamic range, this sensor is suitable for a variety of color imaging applications including multi-media, document scanning, pre-press scanning, medical and machine vision.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Suhail Agwani and James Miller "High-resolution trilinear color TDI CCD image sensor", Proc. SPIE 2654, Solid State Sensor Arrays and CCD Cameras, (25 March 1996);


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