29 March 1996 New method for determining lateral diffusion error in color measurements
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Abstract
A paper presented by the NPIRI Color Measurement Task Force at the 1993 annual TAGA meeting reports that colorimetric measurements made with spectrophotometers manufactured by the same company and with the same geometry can differ by 0.7 to 1 .7 CLab iXE and that values from instruments madeby different manufacturers with the same geometry can differ by 1 .5 to 3 .0 AE'. For the mostpart, we can attribute these measured differences to the instruments since the ink onpaper samples used in this study were prepared using methods which insured minimum differences in the colorimetric and physical characteristics ofthe samples. The causes of these instrument-to-instrument measurement differences can be segregated into two general categories: errors from physical stmcture and adjustment ofthe instrument (e. g. wavelength errors) and errors from interaction ofthe instrument with the samples2. During the past fiveyears, the author has written several papers on one ofthe instrument-sample error mechanisms3'4'5'6. This mechanism was termed translucent blurring error in an investigation that was done by Hsia at NIST (ne NBS)7 and edge loss error in early plastics measurement investigations done by Atkins and Billmeyer8. The author coined the term lateral diffusion error (LDE) about three years ago because he felt that it better described the mechanism of this error: the lateral diffusion of light in the sample to areas not viewed by the instrument detection optics.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David L. Spooner, "New method for determining lateral diffusion error in color measurements", Proc. SPIE 2658, Color Imaging: Device-Independent Color, Color Hard Copy, and Graphic Arts, (29 March 1996); doi: 10.1117/12.236961; http://dx.doi.org/10.1117/12.236961
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KEYWORDS
Reflectivity

Translucency

Glasses

Sensors

Error analysis

Calibration

Diffusion

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