Correlation analysis of pseudo-identical structures for pattern recognition

Vladimir B. Markov; Yobani Mejia; Roman Castaneda

doi:10.1117/12.235458

15 March 1996 Correlation analysis of pseudo-identical structures for pattern recognition

Vladimir B. Markov, Yobani Mejia, Roman Castaneda

Proceedings Volume 2659, Optical Security and Counterfeit Deterrence Techniques; (1996) https://doi.org/10.1117/12.235458
Event: Electronic Imaging: Science and Technology, 1996, San Jose, CA, United States

Abstract

In this report we discuss the method of the analysis of pseudo-identical optical signals. Two similar images, composed by identical apertures, were taken as an example for examination. The difference in their structures can be connected with the value of the apertures' function of transmittance, with the inter-apertures' separation along one direction, or with both these factors simultaneously. The overall functions of the transmittance for this type of pseudo- identical structure can be measured up through comparison of the secondary Fourier spectrums of corresponding transmittance functions.

Citation Download Citation

Vladimir B. Markov, Yobani Mejia, and Roman Castaneda "Correlation analysis of pseudo-identical structures for pattern recognition", Proc. SPIE 2659, Optical Security and Counterfeit Deterrence Techniques, (15 March 1996); https://doi.org/10.1117/12.235458

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