10 January 1996 Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy
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Abstract
Atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM) were used to study optical fiber structures. The refractive index profile of fiber was disclosed by surface topography of etched fiber endface using a AFM. The difference of refractive index was resolved to 1 X 10-6. Near-field optical intensity distribution at fiber endface has been successfully measured by a tapping-mode force regulated SNOM. Combination of tapping-mode AFM and SNOM allowed us to image both refractive index and near-field intensity structures of fibers simultaneously. The correlation between waveguide structures and near-field propagating modes was directly provided by this novel method. Results of single mode fibers and fibers with anisotropic structures illustrated the usefulness of this technique.
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Din Ping Tsai, Din Ping Tsai, Yueh Liang Chung, Yueh Liang Chung, Andreas Othonos, Andreas Othonos, } "Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy", Proc. SPIE 2695, Functional Photonic and Fiber Devices, (10 January 1996); doi: 10.1117/12.229946; https://doi.org/10.1117/12.229946
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