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10 June 1996 Determination of surface atomic layer of RBa2Cu3Oy thin films and SrTiO3 (001) single crystal by glancing-incidence-exit x-ray diffuse scattering
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Abstract
The surface atomic layer of c-axis oriented RBa2Cu3Oy (R equals Nd, Y) thin films deposited by laser ablation process and SrTiO3 (001) single crystal has been studied by using the method of glancing incidence-exit x-ray diffuse scattering (GIEXS). Utilizing the GIEXS we have correctly identified the topmost layer of SrTiO3 (001) single crystal with a well defined surface terminating layer. It demonstrated the effectiveness of GIEXS to distinguish the surface atomic layer from its underlying layered bulk crystal. The observations on the RBa2Cu3Oy thin films using GIEXS proved that the surface of NdBa2Cu3Oy thin films is predominantly terminated with a CuO chain plane, while a different layer covered the surface of YBa2Cu3Oy thin films. The results on the surface of SrTiO3 (001) single crystal indicated that the surface termination layer of SrTiO3 treated by the chemical method was TiO2 plane, while the annealed SrTiO3 surface was mainly terminated with TiO2 plane with a small portion covered by SrO plane.
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Ziyuan Liu, Seiya Ogota, and Tadataka Morishita "Determination of surface atomic layer of RBa2Cu3Oy thin films and SrTiO3 (001) single crystal by glancing-incidence-exit x-ray diffuse scattering", Proc. SPIE 2696, Spectroscopic Studies of Superconductors, (10 June 1996); https://doi.org/10.1117/12.241807
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