PROCEEDINGS VOLUME 2697
PHOTONICS WEST '96 | 27 JANUARY - 2 FEBRUARY 1996
Oxide Superconductor Physics and Nano-Engineering II
PHOTONICS WEST '96
27 January - 2 February 1996
San Jose, CA, United States
Physical Properties of Oxide Superconductors
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 2 (5 July 1996); doi: 10.1117/12.250241
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 38 (5 July 1996); doi: 10.1117/12.250251
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 66 (5 July 1996); doi: 10.1117/12.250271
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 113 (5 July 1996); doi: 10.1117/12.250277
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 9 (5 July 1996); doi: 10.1117/12.250228
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 18 (5 July 1996); doi: 10.1117/12.250229
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 28 (5 July 1996); doi: 10.1117/12.250230
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 120 (5 July 1996); doi: 10.1117/12.250231
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 95 (5 July 1996); doi: 10.1117/12.250232
Thin HTS Film Growth and Characterization
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 250 (5 July 1996); doi: 10.1117/12.250233
Physical Properties of Oxide Superconductors
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 105 (5 July 1996); doi: 10.1117/12.250234
Thin HTS Film Growth and Characterization
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 160 (5 July 1996); doi: 10.1117/12.250235
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 172 (5 July 1996); doi: 10.1117/12.250236
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 202 (5 July 1996); doi: 10.1117/12.250237
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 154 (5 July 1996); doi: 10.1117/12.250238
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 228 (5 July 1996); doi: 10.1117/12.250239
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 259 (5 July 1996); doi: 10.1117/12.250240
Fabrication and Properties of Superconducting Multilayers and Superlattices
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 339 (5 July 1996); doi: 10.1117/12.250242
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 286 (5 July 1996); doi: 10.1117/12.250243
Thin HTS Film Growth and Characterization
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 217 (5 July 1996); doi: 10.1117/12.250244
Fabrication and Properties of Superconducting Multilayers and Superlattices
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 316 (5 July 1996); doi: 10.1117/12.250245
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 328 (5 July 1996); doi: 10.1117/12.250246
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 306 (5 July 1996); doi: 10.1117/12.250247
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 295 (5 July 1996); doi: 10.1117/12.250248
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 403 (5 July 1996); doi: 10.1117/12.250249
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 350 (5 July 1996); doi: 10.1117/12.250250
Intrinsic and Artificial Josephson Junctions
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 458 (5 July 1996); doi: 10.1117/12.250252
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 452 (5 July 1996); doi: 10.1117/12.250253
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 470 (5 July 1996); doi: 10.1117/12.250254
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 464 (5 July 1996); doi: 10.1117/12.250255
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 479 (5 July 1996); doi: 10.1117/12.250256
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 443 (5 July 1996); doi: 10.1117/12.250257
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 424 (5 July 1996); doi: 10.1117/12.250258
Thin HTS Film Growth and Characterization
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 183 (5 July 1996); doi: 10.1117/12.250259
Intrinsic and Artificial Josephson Junctions
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 433 (5 July 1996); doi: 10.1117/12.250260
Physical Properties of Oxide Superconductors
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 44 (5 July 1996); doi: 10.1117/12.250261
Novel HTS Devices
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 520 (5 July 1996); doi: 10.1117/12.250262
Intrinsic and Artificial Josephson Junctions
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 487 (5 July 1996); doi: 10.1117/12.250263
Novel HTS Devices
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 502 (5 July 1996); doi: 10.1117/12.250264
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 508 (5 July 1996); doi: 10.1117/12.250265
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 496 (5 July 1996); doi: 10.1117/12.250266
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 528 (5 July 1996); doi: 10.1117/12.250267
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 539 (5 July 1996); doi: 10.1117/12.250268
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 551 (5 July 1996); doi: 10.1117/12.250269
Physical Properties of Oxide Superconductors
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 77 (5 July 1996); doi: 10.1117/12.250270
Fabrication and Properties of Superconducting Multilayers and Superlattices
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 391 (5 July 1996); doi: 10.1117/12.250434
Physical Properties of Oxide Superconductors
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 87 (5 July 1996); doi: 10.1117/12.250272
Thin HTS Film Growth and Characterization
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 269 (5 July 1996); doi: 10.1117/12.250273
Fabrication and Properties of Superconducting Multilayers and Superlattices
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 361 (5 July 1996); doi: 10.1117/12.250274
Thin HTS Film Growth and Characterization
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 273 (5 July 1996); doi: 10.1117/12.250275
Fabrication and Properties of Superconducting Multilayers and Superlattices
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 413 (5 July 1996); doi: 10.1117/12.250276
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 372 (5 July 1996); doi: 10.1117/12.250278
Thin HTS Film Growth and Characterization
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 240 (5 July 1996); doi: 10.1117/12.250279
Physical Properties of Oxide Superconductors
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 56 (5 July 1996); doi: 10.1117/12.250280
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 129 (5 July 1996); doi: 10.1117/12.250281
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 141 (5 July 1996); doi: 10.1117/12.250282
Thin HTS Film Growth and Characterization
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 211 (5 July 1996); doi: 10.1117/12.250283
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 192 (5 July 1996); doi: 10.1117/12.250284
Fabrication and Properties of Superconducting Multilayers and Superlattices
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, pg 381 (5 July 1996); doi: 10.1117/12.250285
Back to Top