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5 July 1996 Supercurrent distribution and flux penetration in high-Tc edge Josephson junctions
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The spatial distribution of supercurrent in high-Tc Josephson junction devices has been studied extensively using field modulation measurements of the critical current and microwave absorption. The devices are edge junctions composed of YBa2Cu3O7-YBa2Co0.21Cu2.79O7-YBa2Cu3O7. The lc(H) patterns allow a quantitative Fourier transform analysis to obtain a self-consistent spatial supercurrent density distribution, Js(x). These junctions are found to be more homogeneous than in most other high-Tc Josephson junctions reported to date.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mark Lee, Steven C. Gausepohl, and Kookrin Char "Supercurrent distribution and flux penetration in high-Tc edge Josephson junctions", Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, (5 July 1996);

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