Paper
27 May 1996 248-nm laser interaction studies on MgF2/LaF3 optical coatings by mass spectroscopy and x-ray photoelectron spectroscopy
Axel Bodemann, Norbert Kaiser, L. Raupach, Peter Weissbrodt, Erich J. Hacker
Author Affiliations +
Abstract
A UHV surface analysis system combined with an optical setup was used in the present work to study the conditioning mechanism on MgF2?/LaF3 HR coatings at 248 nm excimer laser wavelength. During laser irradiation of the sample the laser-induced emission of contaminants and coating material from the sample surface was recorded by a quadrupole mass spectrometer. To analyze changes in composition and chemical bonds of the coating surface XPS-measurements were performed before, during and after irradiation in dependence on sample design, number of pulses and oxygen atmosphere.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Axel Bodemann, Norbert Kaiser, L. Raupach, Peter Weissbrodt, and Erich J. Hacker "248-nm laser interaction studies on MgF2/LaF3 optical coatings by mass spectroscopy and x-ray photoelectron spectroscopy", Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); https://doi.org/10.1117/12.240361
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Contamination

Optical coatings

Excimer lasers

Mass spectrometry

Oxygen

Mirrors

Multilayers

RELATED CONTENT

Multilayer soft x-ray optics
Proceedings of SPIE (October 20 2014)
Study of soft x-ray multilayer thin film
Proceedings of SPIE (October 26 1994)
Time stability of multilayer reflectivity
Proceedings of SPIE (November 11 1994)

Back to Top