27 May 1996 Comprehensive characterization of micro-arcing related particles
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Yuri S. Uritsky, J. T. Pan, Terry Francis, C. R. Brundle, "Comprehensive characterization of micro-arcing related particles", Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); doi: 10.1117/12.240417; https://doi.org/10.1117/12.240417

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