Translator Disclaimer
21 May 1996 Rapid and accurate measurements of photoresist refractive index dispersion using the prism coupling method
Author Affiliations +
Abstract
A commercially available instrument (MetriconTM 2010) was used to perform refractive index measurements at wavelengths of 543 nm, 632.8 nm and 780 nm on AZR photoresist and antireflection (AR) coating products. This instrument is computer-controlled and performs all analyses required to determine film indices and thicknesses. The samples were various i-line and g-line photoresists and AR coatings, spun onto silicon at thicknesses of approximately 1 - 2 microns. The reproducibility of the refractive index measurements at different spots on a given sample was found to be very high (usually less than 0.0002) and the time to measure one sample at all the wavelengths was about 15 minutes. The data were fit to a Cauchy function and low error fits were obtained. Most photoresists measured exhibited similar values for the Cauchy coefficients, while BARLiTM had much different coefficients, owing to its large absorption in the visible.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert A. Norwood and Lisa A. Whitney "Rapid and accurate measurements of photoresist refractive index dispersion using the prism coupling method", Proc. SPIE 2725, Metrology, Inspection, and Process Control for Microlithography X, (21 May 1996); https://doi.org/10.1117/12.240103
PROCEEDINGS
8 PAGES


SHARE
Advertisement
Advertisement
Back to Top