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5 February 1996 Probe-beam scanning method for beam-coupling monitoring in photorefractive crystals
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Proceedings Volume 2730, Second Iberoamerican Meeting on Optics; (1996) https://doi.org/10.1117/12.231044
Event: Second Iberoamerican Meeting on Optics, 1995, Guanajuato, Mexico
Abstract
We describe a technique for investigation of beam coupling in photorefractive materials. We used a probe beam which partly erases the recorded hologram in a small region of the crystal. This erasure changes the coupling between the beams, then the output intensities of these beams are changed. We show by numerical simulations that these changes give us information about coupling coefficient along the length of the photorefractive sample. We compare the numerical results with experimental data of two-beam coupling in an optical active BTO waveguide-like crystal.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Garcia-Weidner, A. V. Khomenko, and Diana Tentori-Santa-Cruz "Probe-beam scanning method for beam-coupling monitoring in photorefractive crystals", Proc. SPIE 2730, Second Iberoamerican Meeting on Optics, (5 February 1996); https://doi.org/10.1117/12.231044
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