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5 February 1996 Z-scan technique for thick thermal media
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Proceedings Volume 2730, Second Iberoamerican Meeting on Optics; (1996) https://doi.org/10.1117/12.231015
Event: Second Iberoamerican Meeting on Optics, 1995, Guanajuato, Mexico
Abstract
We present a theoretical and experimental analysis of the Z-scan technique in thick media with thermal nonlinearity in steady-state regime. The theoretical model considers the thick medium as a stack of thin thermal lenses. Numerical solution for the Z-scan technique is obtained. Experimental results for the technique using a sample of methylene blue in a solvent under cw illumination from a 10 mW He-Ne laser beam are obtained. Comparison of the experimental and theoretical results is made. Good agreement between theory and experiment is obtained.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marcela M. Mendez-Otero, Marcelo David Iturbe Castillo, Jose Javier Sanchez-Mondragon, and Serguei I. Stepanov "Z-scan technique for thick thermal media", Proc. SPIE 2730, Second Iberoamerican Meeting on Optics, (5 February 1996); https://doi.org/10.1117/12.231015
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