29 October 1981 Applicability Of The Optical Transfer Function (OTF) Concept To Thermal Imaging Systems
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Proceedings Volume 0274, Assessment of Imaging Systems II; (1981) https://doi.org/10.1117/12.931857
Event: Assessment of Imaging Systems: Visible and Infrared, 1981, Reading, United Kingdom
Abstract
Existing standards on the optical transfer function ( OTF ) can not directly be applied to thermal imaging systems or to similar opto-electronic systems. Imaging characteristics such as a limited linear range, ac-coupling and high frequency boost or jitter, drift and flicker require more sophisticated OTF measurement techniques and a further development of the conventional OTF concept. Sampling and aliasing effects due to the raster structure of the system or to electronic multiplexing force new definitions which allow the expansion of the OTF concept to such systems. The paper gives a review of major system features that affect the OTF measurement and presents the work of an international study group that was directed toward the establishment of an OTF standard for thermal imaging systems.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. Wittenstein, W. Wittenstein, } "Applicability Of The Optical Transfer Function (OTF) Concept To Thermal Imaging Systems", Proc. SPIE 0274, Assessment of Imaging Systems II, (29 October 1981); doi: 10.1117/12.931857; https://doi.org/10.1117/12.931857
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