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17 June 1996 Optical properties measurements, instrumentation, and analytical tools for interactive signature analysis of targets and backgrounds
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Abstract
A new era in signature simulation has arrived with the development of a family of instruments for the measurement of optical properties of materials. These new instruments, covering the spectral range from 0.2 to 200 microns plus millimeter waves, have been mated with workstations which control the measurement processes, and on which software for data analysis, signature simulation, and coatings design reside. Portability of the instruments allows measurements and analysis in the laboratory, or in the field. For the first time an analyst can affordably make rapid measurements of such quantities as bi-directional or directional reflectance/emittance of sample materials, analyze, plot, and archive the measurements, and then immediately use the new measurements in a signature simulation of targets, backgrounds and scenes. Alternatively, the analyst can design a unique coating and immediately subject the design to iterative analysis for target signature control or deception. This paper discusses the instruments and techniques for accomplishing the measurements and analysis.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William T. Kreiss, Richard Sam Dummer, and James C. Jafolla "Optical properties measurements, instrumentation, and analytical tools for interactive signature analysis of targets and backgrounds", Proc. SPIE 2742, Targets and Backgrounds: Characterization and Representation II, (17 June 1996); https://doi.org/10.1117/12.243020
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