10 June 1996 Fast slit-scan method for MTF and MRTD characterization in the HITL environment
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Abstract
A method based on the line scan of a narrow slit pattern is described for MTF and MRTD determinations. A digital signal analyzer and automatic computer worksheet are utilized for executing this methodology. This single-scan procedure can replace a series of measurements with different sized bar patterns, and it facilitates rapid imaging system characterization for weapons scheduled for intensive hardware-in-the-loop testing. The challenge of this method was to overcome the practical data processing problems encountered. MRTD determinations using the slit-scan method agree very well with conventional bar pattern measurements and has been validated for a variety of imaging sensors. The automatic worksheet analysis determines MTF and both the objective, line scan MRTD as well as the 'eye-brain MRTD' based on a human vision model.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James Lynn Smith, James Lynn Smith, } "Fast slit-scan method for MTF and MRTD characterization in the HITL environment", Proc. SPIE 2743, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VII, (10 June 1996); doi: 10.1117/12.241962; https://doi.org/10.1117/12.241962
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