27 June 1996 Evaluation of the 1040 x 1040 PtSi CSD for astronomical use
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Abstract
We present the performance of the 1040 by 1040 PtSi CSD manufactured by Mitsubishi Electric Co. for an application of astronomical imaging. The sensor was evaluated both in laboratory and in real observing conditions. The results of noise, quantum efficiency, linearity, dark current and photometric accuracy are presented.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kenshi Yanagisawa, Nobunari Itoh, and Takashi Ichikawa "Evaluation of the 1040 x 1040 PtSi CSD for astronomical use", Proc. SPIE 2744, Infrared Technology and Applications XXII, (27 June 1996); doi: 10.1117/12.243453; https://doi.org/10.1117/12.243453
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