Evaluation of the 1040x1040 PtSi CSD for astronomical use

Kenshi Yanagisawa; Nobunari Itoh; Takashi Ichikawa

doi:10.1117/12.243453

27 June 1996 Evaluation of the 1040 x 1040 PtSi CSD for astronomical use

Kenshi Yanagisawa, Nobunari Itoh, Takashi Ichikawa

Proceedings Volume 2744, Infrared Technology and Applications XXII; (1996) https://doi.org/10.1117/12.243453
Event: Aerospace/Defense Sensing and Controls, 1996, Orlando, FL, United States

Abstract

We present the performance of the 1040 by 1040 PtSi CSD manufactured by Mitsubishi Electric Co. for an application of astronomical imaging. The sensor was evaluated both in laboratory and in real observing conditions. The results of noise, quantum efficiency, linearity, dark current and photometric accuracy are presented.

Citation Download Citation

Kenshi Yanagisawa, Nobunari Itoh, and Takashi Ichikawa "Evaluation of the 1040 x 1040 PtSi CSD for astronomical use", Proc. SPIE 2744, Infrared Technology and Applications XXII, (27 June 1996); https://doi.org/10.1117/12.243453

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