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22 March 1996 Implementation of model-based intelligent next-generation test generator using neural networks
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Abstract
This work, investigated the use of Neural Network technology to simulate faults and to generate input/output patterns used to diagnose electronic circuits via pattern classification. There are several types of circuits (i.e., digital, analog, hybrid (digit-analog), RF, and microwave). This study focused on digital circuits while maintaining the posture of considering other types in the future with similar solutions. The main focus was to investigate a methodology to model complex digital components using system identification neural network architectures. Using those components in software, a digital circuit was assembled. Faults indicating stuck at 1 or 0 was propagated through the circuit (one at a time). Input and output sequences were combined for each situations modeled and those sequences were classified to the known modeled behavior using the Adaptive Resonance Theory neural network algorithm. In addition, a data reduction methodology was established to generate input patterns required for the recognition scheme.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Steven Michael Singer "Implementation of model-based intelligent next-generation test generator using neural networks", Proc. SPIE 2760, Applications and Science of Artificial Neural Networks II, (22 March 1996); https://doi.org/10.1117/12.235969
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