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15 March 1996 Analysis methods for full-field time-resolved infrared radiometry
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A data analysis procedure is described to enable quantitative information about defect depth and surface and subsurface thermal properties to be obtained from the time series of images acquired in a time-resolved infrared radiometry (TRIR) measurement. While the approaches described have been previously considered for single point measurements, in this work the algorithms are applied to full field images. As a result, images presenting defect depth and amount of thermal mismatch at subsurface interfaces can be constructed. Results are presented for composite test panels with flat-bottomed holes milled to different depths, two-layer specimens with differing thermal properties between the top layer and the substrate and a graphite/epoxy-honeycomb composite panel with simulated delaminations.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert Osiander, Jane W. Maclachlan Spicer, and John C. Murphy "Analysis methods for full-field time-resolved infrared radiometry", Proc. SPIE 2766, Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications, (15 March 1996);

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