15 March 1996 Measuring defect depths by thermal-wave imaging
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Abstract
We describe a thermal wave technique for making defect depth determinations. Both theory and experiment are presented, and the results are compared. Examples of defects having different lateral dimensions and boundary conditions are given.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lawrence D. Favro, Lawrence D. Favro, Xiaoyan Han, Xiaoyan Han, Pao-Kuang Kuo, Pao-Kuang Kuo, Robert L. Thomas, Robert L. Thomas, } "Measuring defect depths by thermal-wave imaging", Proc. SPIE 2766, Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications, (15 March 1996); doi: 10.1117/12.235380; https://doi.org/10.1117/12.235380
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