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13 February 1996 Absolute measurements of soft X-ray emission by laser plasma using thermoluminescent dosimeters and semiconductor detectors
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Proceedings Volume 2767, Fourth International Workshop on Iodine Lasers and Applications; (1996) https://doi.org/10.1117/12.232174
Event: Fourth International Workshop on Iodine Lasers and Applications, 1995, Trest' Castle, Czech Republic
Abstract
Thermoluminescent dosimeters LiF:Mg,Ti (TLD100), LiF:Mg,Cu,P (GR200A) and CaF2:Dy (TLD200) as well as Si commercial photodiodes, Polish production, BPYP44 type, were used for time-integrated absolute measurements of x-ray emission from laser-produced plasmas generated by a Nd:glass laser or an iodine photodissociation laser. All the detectors were calibrated by application of radioactive standard sources. Calibrated responses to x-ray radiation emitted from a laser-produced Al plasma are compared and a discrepancy in the results is discussed.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Farnikova, Josef Krasa, Bozena Kralikova, Jiri Skala, Piotr Parys, Leszek Ryc, Jerzy Wolowski, and Eugeniusz Woryna "Absolute measurements of soft X-ray emission by laser plasma using thermoluminescent dosimeters and semiconductor detectors", Proc. SPIE 2767, Fourth International Workshop on Iodine Lasers and Applications, (13 February 1996); https://doi.org/10.1117/12.232174
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