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13 February 1996 Flat-field XUV spectrograph with spatial resolution in wide-wavelength range
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Proceedings Volume 2767, Fourth International Workshop on Iodine Lasers and Applications; (1996) https://doi.org/10.1117/12.232173
Event: Fourth International Workshop on Iodine Lasers and Applications, 1995, Trest' Castle, Czech Republic
Abstract
A space-resolved spectrum was obtained using a flat-field XUV spectrograph system, composed of a varied line-spacing concave grating, a toroidal mirror, and a 40 micrometer- width slit. The toroidal mirror is used in order to compensate for the astigmatism due to the grazing incidence of light at the grating. The spectral resolution of the spectrograph system was measured with the XUV spectra emitted from laser plasma produced by an iodine laser. The spatial resolution of the spectrograph system was obtained by calculating transverse ray aberrations with the wave front aberration for the system.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
ChangHee Nam, Il Woo Choi, and Hyun-Joon Shin "Flat-field XUV spectrograph with spatial resolution in wide-wavelength range", Proc. SPIE 2767, Fourth International Workshop on Iodine Lasers and Applications, (13 February 1996); https://doi.org/10.1117/12.232173
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