1 September 1996 Analysis of x-ray interferometers for phase distribution measurement
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Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 277808 (1996) https://doi.org/10.1117/12.2298890
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of
Abstract
The X-ray interferometers are analyzed as a tool to measure a phase distribution of X-ray beams transmitted through phase objects. We calculate beam width using a dynamical diffraction theory of a spherical wave. The width defines the image resolution. From these results, it is found that the X ray quadruple-Lane-case (LLLL) interferometer has high image resolution compared with the X-ray triple-Lane-case (LLL) interferometer.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. Nakano, T. Nakano, } "Analysis of x-ray interferometers for phase distribution measurement", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 277808 (1 September 1996); doi: 10.1117/12.2298890; https://doi.org/10.1117/12.2298890
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