1 September 1996 Critical light reflection from curved liquid surface and apptication for measuring contact angle
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Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 27780T (1996) https://doi.org/10.1117/12.2298911
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of
Abstract
Critical tight reflection, interforence and diffraction from raised and depressed curved liquid surface were discovered and its extraordinary intensity distribution photographed. Their formation and characters were discussed as wet 1, Furthermore, The applications formeasuring contact angle were discribed and experimental results were reported.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Run Cai Miao, "Critical light reflection from curved liquid surface and apptication for measuring contact angle", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27780T (1 September 1996); doi: 10.1117/12.2298911; https://doi.org/10.1117/12.2298911
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