1 September 1996 Characterization of aliased fresnel hologram by pixel phase error function
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Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 27780Z (1996) https://doi.org/10.1117/12.2298917
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of
Abstract
We present what is to our knowledge the first experimental observation of the controlled intensity fluctuations of aliased Fresnel holograms of an 8pmx8pm pixel size by using an analytical function for calculating optical phase errors from the pixel area of an aperture of synthetic Fresnel holograms.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Raimo Silvennoinen, Raimo Silvennoinen, } "Characterization of aliased fresnel hologram by pixel phase error function", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27780Z (1 September 1996); doi: 10.1117/12.2298917; https://doi.org/10.1117/12.2298917
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