1 September 1996 Image formation in the near-field scanning optical microscope
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Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 27781G (1996) https://doi.org/10.1117/12.2298934
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of
Abstract
The near-field scanning optical microscope (NSOM) has been developed to extract optical information from a nanometric area of sample. The amount of information contained in an NSOM image is potentially vast but it could not yet be fully exploited because of the need for a more complete understanding of the effects of the probe-sample interaction on the imaging process. A better understanding will lead to an unambiguous analysis of an NSOM image and will make the NSOM a reliable imaging tool. In this paper, we present the analysis of NSOM imaging through the numerical calculation based on an electromagnetic-theory-based algorithm,called Finite-Difference Time-Domain method (FDTD).
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hiromitsu Furukawa, Hiromitsu Furukawa, "Image formation in the near-field scanning optical microscope", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27781G (1 September 1996); doi: 10.1117/12.2298934; https://doi.org/10.1117/12.2298934
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