1 September 1996 Imaging with reflection near-field optical microscope in light of evanescent dipole radiation
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Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 27781Y (1996) https://doi.org/10.1117/12.2298952
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of
Abstract
A theory to decompose the propagating waves and the evanescent field in the optical dipole radiation is applied to analyze the reflection near-field optical microscopy. It is theoretically and numerically demonstrated that a local field vertically polarized toward the sample surface at the very end of the probe will provide a longer evanescent field tail into the gap between the probe and the sample and, hence, will improve the imaging quality of the microscope.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mufei Xiao, Mufei Xiao, } "Imaging with reflection near-field optical microscope in light of evanescent dipole radiation", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27781Y (1 September 1996); doi: 10.1117/12.2298952; https://doi.org/10.1117/12.2298952
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