1 September 1996 Measurement of grain boundary sliding in copper by two-beam interferometry
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Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 27782K (1996) https://doi.org/10.1117/12.2298974
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of
Abstract
A two-beam interferometry has been used to determine the extent of grain boundary sliding contribution to total creep deformation in polycrystalline copper. The sliding strain was evaluated from the relationship, egbδ (%) - Φv̄/d, where Φ is geometrical factor, is mean vertical offset and d is grain size.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Ayensu, "Measurement of grain boundary sliding in copper by two-beam interferometry", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27782K (1 September 1996); doi: 10.1117/12.2298974; https://doi.org/10.1117/12.2298974
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