1 September 1996 Quantitative analysis of white light fringes in differential interference microscope
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Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 27782U (1996) https://doi.org/10.1117/12.2298984
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of
Abstract
A new method to determine optical pass differences of white light interference fringes based on spectral analysis and subspace method is proposed and applied to analyze an image of a differential interference microscope. Experiments to measure curvature of a bearing bowl well agreed with the value measured by a digital micrometer.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Toyooka, "Quantitative analysis of white light fringes in differential interference microscope", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27782U (1 September 1996); doi: 10.1117/12.2298984; https://doi.org/10.1117/12.2298984
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