1 September 1996 Determination of the metallic particle size on flat substrates by means of light scattering experiments
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Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 27783A (1996) https://doi.org/10.1117/12.2299000
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of
Abstract
A fast and accurate method is introduced and analyzed for size determination of metallic particles on flat substrates. It is based on the measurement of the minima angular positions of the S-polarized far field scattering patterns at normal incidence. The method has been theoretically and experimentally checked for both cylindrical and spherical protuberance geometry on conducting flat substrates.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. González, F. González, } "Determination of the metallic particle size on flat substrates by means of light scattering experiments", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27783A (1 September 1996); doi: 10.1117/12.2299000; https://doi.org/10.1117/12.2299000
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