1 September 1996 Fabrication of infrared interferometer and its application for characterization of Ge
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Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 27783T (1996) https://doi.org/10.1117/12.2299019
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of
Abstract
A Fizeau type infrared(IR) interferometer was fabricated and its performance was characterized using a Ge and other infrared materials. A IR He-Ne laser(wavelength of 3.39micron) was used as a coherent light source and an infrared imaging camera system was used for data acquision and processing. An annealing effect of single crystal, polycrystal and cast grown Ge was investigated using the interferometer. IR transmission images of Ge were also observed using a black-body source and IR camera.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Moriaki Wakaki, Moriaki Wakaki, } "Fabrication of infrared interferometer and its application for characterization of Ge", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27783T (1 September 1996); doi: 10.1117/12.2299019; https://doi.org/10.1117/12.2299019
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