1 September 1996 Scattering in multilayers with shallow rough interfaces
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Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 27785I (1996) https://doi.org/10.1117/12.2299081
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of
Abstract
Scattering at rough interfaces and guided modes in the bulk of a given layer are the cause of severe modifications in the optical performance of multilayer stacks, specially when some electromagnetic resonances occur, this is a typical case in alternate absorbing and transparent layers, where surface plasma waves may be excited. We present calculations of the scattered fields in the transmitted and reflected directions in a L-film system with shallow - rough interfaces that can be modelled as periodic, random or deterministic along the direction perpendicular to the incident plane beam. Because of the dimension of roughness we use the Rayleigh approximation and obtain a couple of integral equations to be solved numerically in a quasi-recursive way by using the input parameters, dielectric constants and thicknesses of all media, angle of incidence and wavelength. Some experimental results for the scattered reflected and transmitted fields for two and three films are presented and discussed here.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Victor Monárrez Pérez, "Scattering in multilayers with shallow rough interfaces", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27785I (1 September 1996); doi: 10.1117/12.2299081; https://doi.org/10.1117/12.2299081
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