Diffraction ring pattern and z-scan measurement of amorphous As2S3 thin film

Yeung Joon Sohn

doi:10.1117/12.2316077

1 September 1996 Diffraction ring pattern and z-scan measurement of amorphous As₂S₃ thin film

Yeung Joon Sohn

Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 2778AS (1996) https://doi.org/10.1117/12.2316077
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of

Abstract

The complex nonlinear refractive index has been measured and analyzed by adapting the sensitive cw z-scan technique in an amorphous As₂S₃ thin film. Diffraction rings which is caused by spatial self phase modulation are also observed.

Citation Download Citation

Yeung Joon Sohn "Diffraction ring pattern and z-scan measurement of amorphous As₂S₃ thin film", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778AS (1 September 1996); https://doi.org/10.1117/12.2316077

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