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1 September 1996 Analysis of z-scan technique in photorefractive crystals
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Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 2778C8 (1996) https://doi.org/10.1117/12.2316129
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of
Abstract
The far-field diffraction pattern of a photorefractive crystal under an external applied electric field in a Z-scan configuration is derived based on the analysis of the propagation of a Gaussian beam wavefront with spatial phase distortion. The effective electro-optic coefficient of a SBN:Ce crystal is determined from the Z-scan experiments. Enhanced sensitivity is predicted if the light irradiance is measured at the ofd axis positions in the far field.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shaoping Bian "Analysis of z-scan technique in photorefractive crystals", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778C8 (1 September 1996); https://doi.org/10.1117/12.2316129
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