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1 September 1996 Topological phase and interpretation of the interferometer data
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Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 2778F0 (1996) https://doi.org/10.1117/12.2316229
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of
Abstract
There have been many recent manifestations. of topological phases in optics, but in the all works, both theoretical and experimental, these phases are considered only as some interesting natural phenomena. We will show that topological phases can be used for constructing the devices capable of measurement both geometrical and optical characteristics of a surface, that is combining the properties of profilometer and ellipsometer.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. A. Andreev "Topological phase and interpretation of the interferometer data", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778F0 (1 September 1996); https://doi.org/10.1117/12.2316229
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