Measuring refractive indices from interferograms in the soft x ray range

D. Joyeux

doi:10.1117/12.2316284

1 September 1996 Measuring refractive indices from interferograms in the soft x ray range

D. Joyeux

Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 2778GJ (1996) https://doi.org/10.1117/12.2316284
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of

Abstract

The luminance¹ of third generation synchrotron sources, (ALS, Elettra) and even some older ones such as NSLS (line X1A) ar BNL, and Super ACO (line 5U7) at Orsay which we are using, is now large enough to allow the practical construction of interferometers and transfer all applications of interferometry to the soft X ray domain (λ = 2-10 nm). Our purpose with the present work is to transpose to soft X rays the concept of measuring the real part n = 1-δ of the refractive index from the fact that interference patterns are shifted by eδ/λ fringes when a sample of thickness e is inserted in one arm of the interferometer. The n values of all materials in that range are quite close to unity and determination methods used so far are generally indirect and strongly affected by absorption. While of course a large imaginary part of the refractive index, i.e. the absorption, ultimately affects the interference contrast and therefore the accuracy, it does not affect the average value, which allows to expect a significant gain in accuracy from interferometry.

Citation Download Citation

D. Joyeux "Measuring refractive indices from interferograms in the soft x ray range", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778GJ (1 September 1996); https://doi.org/10.1117/12.2316284

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