8 April 1996 1/f noise in systems with exponentially wide spectrum of resistances
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Proceedings Volume 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications; (1996) https://doi.org/10.1117/12.238132
Event: Metal/Nonmetal Microsystems: Physics, Technology, and Applications, 1995, Polanica Zdroj, Poland
Abstract
Numerical simulations of 1/f noise in random networks in which bonds take resistances r approximately equals exp(-(lambda) x), where x is a random variable and (lambda) >> 1, are presented. For microscopic noise generating mechanism which obeys the form of {(delta) r(delta) r} approximately equals r2 $plus (theta ) it is shown that the effective noise intensity C equivalent S(Omega) , where S is the relative power spectral density of the fluctuations (delta) R of the resistance R of the network and (Omega) is the networks volume, is given by C approximately equals (lambda) mexp(- (lambda) (theta) xc) where Xc is related to percolation threshold. Numerical simulations performed for (theta) equals 1 and (theta) equals 0 give m equals 2.3 and show that exponent m is 'double universal' i.e., it is independent of the geometry of the lattice and of microscopic noise generating mechanism.
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Andrei A. Snarskii, Andrei A. Snarskii, A. E. Morozovsky, A. E. Morozovsky, Andrzej Kolek, Andrzej Kolek, "1/f noise in systems with exponentially wide spectrum of resistances", Proc. SPIE 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications, (8 April 1996); doi: 10.1117/12.238132; https://doi.org/10.1117/12.238132
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