8 April 1996 Microcharacterization of semiconductor laser diodes: materials and devices
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Proceedings Volume 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications; (1996) https://doi.org/10.1117/12.238185
Event: Metal/Nonmetal Microsystems: Physics, Technology, and Applications, 1995, Polanica Zdroj, Poland
Abstract
This paper illustrates the application of microscopy techniques to investigate various material processing and device-related problems that one encounters in the development of semiconductor laser diodes. General comments are made concerning local characterization of semiconductors. Various laser reliability/degradation issues are addressed. As an example of how microscopy techniques facilitate the building of modern lasers, the application of the ordering phenomenon is discussed.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Abram Jakubowicz, Abram Jakubowicz, } "Microcharacterization of semiconductor laser diodes: materials and devices", Proc. SPIE 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications, (8 April 1996); doi: 10.1117/12.238185; https://doi.org/10.1117/12.238185
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