18 September 1996 Differential optical profilometer using a single probe beam
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Proceedings Volume 2782, Optical Inspection and Micromeasurements; (1996) https://doi.org/10.1117/12.250795
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France
This paper describes a heterodyne common path differential phase interferometer which is resistant to the thermally and microphonically induced measurement errors of non-common path systems. The system utilizes a single probe beam which is focused onto the sample and then imaged onto the detector plane. Differentiation in any direction can be performed by altering the positions of the detectors. A theoretical derivation of the system transfer function is presented, the results from which show excellent agreement with experimental measurements. Initial theoretical results of the recovery of a sample profile from its differential profile are presented. Finally, a simplified and more stable differential system is introduced.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
N. B. E. Sawyer, N. B. E. Sawyer, Chung Wah See, Chung Wah See, Michael G. Somekh, Michael G. Somekh, "Differential optical profilometer using a single probe beam", Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); doi: 10.1117/12.250795; https://doi.org/10.1117/12.250795

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