18 September 1996 High-speed two-dimensional fringe analysis using frequency demodulation
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Proceedings Volume 2782, Optical Inspection and Micromeasurements; (1996) https://doi.org/10.1117/12.250766
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France
Abstract
This paper describes a new high speed 2D fringe analysis technique in the time domain using an electric circuit based on frequency demodulation. A 1D fringe analysis system based on this new technique has already been built, and its performance and characteristics were reported. With that system, a 1D fringe pattern could be processed every 10 msec. The accuracy was better than 1/20 fringe. In this paper, the principle of 1D fringe analysis is expanded to two dimensions. New electric circuits with which to process horizontal (x-) and vertical (z-) directional simultaneously were built. The paper proposes principles for the design of such circuits, which combine two outputs--one for the x- direction and the other for the z-direction. A new 2D fringe analysis system was then built using both analogue and digital processing circuits. Each fringe pattern was treated as an analogue signal synchronized with the CCD clock-pulse in the system. Using this new fringe analysis method, high- speed 2D image-processing can be realized. The system can process fourteen images a second. The characteristics of a laboratory prototype of this fringe analysis system were tested.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yasuhiko Arai, Shunsuke Yokozeki, Kazuhiro Shiraki, Tomoharu Yamada, "High-speed two-dimensional fringe analysis using frequency demodulation", Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); doi: 10.1117/12.250766; https://doi.org/10.1117/12.250766
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