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18 September 1996 Interferometric deformation measurement using object-induced dynamic phase-shifting
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Proceedings Volume 2782, Optical Inspection and Micromeasurements; (1996)
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France
A new method is presented that allows continuous deformation measurements to be performed. It is based on the use of the deformation-induced phase change produced at each pixel to compute an instantaneous phase with a dedicated phase- shifting algorithm. Examples in holographic, speckle and decorrelated speckle interferometry illustrate the interest of the method which provides both relative displacement phase maps and absolute temporal phase evolution curves.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xavier Colonna de Lega and Pierre M. Jacquot "Interferometric deformation measurement using object-induced dynamic phase-shifting", Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996);

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