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18 September 1996 Measuring the deformations of a scattering surface with a general purpose interferometer
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Proceedings Volume 2782, Optical Inspection and Micromeasurements; (1996) https://doi.org/10.1117/12.250810
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France
Abstract
The present work demonstrates the use of a general purpose interferometer to measure the deformations of a scattering surface by processing speckle patterns instead of smooth wavefronts. The operation of the interferometer are re- programmed to include algorithms adapted to handling speckle patterns. Details of the measuring operation are described, limits of applicability are discussed, and experimental results are presented.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marcelo Trivi, Vincenzo Greco, Lois M. Hoffer, and Giuseppe Molesini "Measuring the deformations of a scattering surface with a general purpose interferometer", Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); https://doi.org/10.1117/12.250810
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